Agilent i3070 系列 6 在线测试（在线ICT）系统以久经验证的技术为基础设计，可提供经过时间考验的软件、硬件和编程功能，大大提高测试效率。 i3070 系列 6 在线ICT 测试仪支持多种印刷电路板组件（PCBA）尺寸，适用于 IoT（物联网）、5G 以及汽车和能源等应用。 i3070 采用了独特的设计，使测量电路与被测器件之间的信号路径尽量缩短，从而最大限度减少寄生电容的不良影响，提高抗串扰能力，消除杂散信号耦合效应，轻松提供一致且可重复的测量结果。 系列 6 完全向后兼容以前的系统，能够执行高度可重复的测量。
- 最大节点数：5184
- 最大通道数：1152
- 占用面积：1.49 米 x 0.94 米或 4.89 英尺 x 3.08 英尺
- 最大模块数：4
i3070 系列 6 ICT 能为客户提供：
- 更高的测试效率――硅钉测试/边界扫描速度加快 40% 以上，在测试大部分 PCBA 时，总体速度加快 6% 以上
- 100% 向后兼容性，保证尽量缩短安装所需要的停机时间，并实现完整的代码兼容性
- IPC 联网工厂交换（IPC-CFX）和 IPC-HERMES-9852 标准等机器对机器（M2M）功能已获认证，可以提高您的操作效率，加深对测试数据的洞察，缩短响应时间并降低操作成本
- 现代化的软件许可方案让您可以清晰了解许可证成本，集中管理许可证，还可根据生产需求进行扩展
新型 Agilent i3070 系列 6 在线测试平台提供了可转移的测试功能，并增添了先进的工业 4.0 技术，从而可以为我们的主要印刷电路板组件制造客户带了更高良率、更快的吞吐量和更出色的操作效率。
| Item | Keysight i3070S6 |
| Maximum channels | 1152 |
| Maximum nodes | 5184 |
| Pin Card | HybridPlus double density |
| Driver/Receiver Mux ratio | 9:2 multiplexing |
| Vector application rate | 6MPs,12MPs,20MPs |
| Logic level | -3.5V to 5V(Per Digital Channel pin programmable) |
| Logic threshold | Dual threshold |
| Slew rate | 25V/us to 275V/us |
| Digital driver/receiver offset | -30n to 100n |
| Operating system | windows 10 |
| Test generation toolset | Board Consultant/fixture consultant/test consultant |
| Board/fixture graphics display | Board Consultant/fixture consultant/test consultant |
| Circuit analysis | Automatic(IPG)with Monte carlo Simulation |
| Probe pin locator | Interactive probe/pin locator with guided probed |
| Runtime yield display | Real time FPY(First Pass Yield) display at runtime |
| Probe/fixture maintenance tools | Worse probe reporting(Reports real time fixture probe number that fails frequently) |
| Analog unpowered debug interface | Graphical user interface in spread sheet format |
| Digital/Analog powered debug interface | Push-button Debug |
| AutoDebug | AutoDebug on Analog unpowered tests, Testjet and VTEP v2.0 (VTEP, iVTEP and NPM) |
| Modular construction for flexibility/scalability | (1 to 4) Standard |
| Dual-well construction for maximum throughput | Standard |
| Failure message printer | Yes |
| Vacuum solenoids | Built-in standard |
| Analog unpowered measurement | 2,4,6 wire measurement |
| Backdriving current | 750mA |
| Backdriving test program setup | Automatic by logic family |
| Overvoltage protection | Yes |
| Capacitor discharge protection | Yes |
| Arbitrary waveform generator | Yes |
| Fixture types supported | Short wire,NoWire,Long wire |
| Repeatability | Excellent |
| Transportability | Excellent |
| Temperature compensation | AutoAdjust@Every 5 degrees celsius temperature drift/1000Hrs |
| Open/short testing | Automatic IPG |
| Analog testing | Yes |
| Vector programming | VCL and PCF |
| Vectorless testing | VTEP V2.0 and TestJet |
| Disabling analysis | Automatic(IPG) |
| Digital test pattern generator | Yes |
| Frequency measurement | 60Mhz(Beyond 60Mhz measurement possible using fixure electronics solution) |
| Multilevel disable(digital isolation) | Yes |
| High-voltage testing capability | 100V |
| Low-voltage testing capability | No limit |
| Number of analog guarding points | Unlimited |
| Worst probe report | Yes |
| First pass yield report | Yes |
| Component-level coverage report | Yes |
| Limited access tools | Yes |
| Flash 70 device programming | Yes |
| Polarity check software | Yes |
| ICT Boundary Scan | Yes |
| PanelTest for panelized PCBAS | Yes |
| No-wire fixture development software | Yes |
| Multiple board versions software | Yes |
| Dual-well sharing | Yes |
| Throughput multiplier | Yes |
| SPC quality tool | Push-button Q-stats |
评论